Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

This video from Bruker shows the recent advances in AFM instrumentation on DNA. The visualization of helical characteristics of DNA is now possible with Bruker's PeakForce Tapping mode in AFM. This ...

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, works closely with users at the University of Sheffield where their ...

Scientists have combined atomic force microscopy and mass spectrometry into one instrument that can probe a polymer sample in three dimensions and overlay information about the topography of its ...

JPK Instruments reports on the use of their AFM system, the NanoWizard® in the Physics Department at Swansea University. Dr Peter Dunstan is an associate Professor in the Department of Physics at ...

AFM-IR designer: Rohit Bhargava and colleagues have developed a new chemical imaging technique. (Courtesy: L Brian Stauffer, University of Illinois at Urbana-Champaign) A new closed-loop microscopy ...

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of their NanoWizard® AFM system in the Institute of ...

Scientists and engineers have for many years relied on atomic force microscopy (AFM) to reveal the secrets of materials at the nanoscale. This powerful and versatile technique, first invented by ...

MadPLL™ is a fully integrated instrument package that allows the user to create an inexpensive, high resolution resonant scanning probe microscope. In short, MadPLL™ can create an “instant” closed ...