Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Polymers are crucial across multiple sectors, including food packaging, tire fabrication, adhesives, and medical‑grade plastics. Photothermal atomic force microscope‑based infrared spectroscopy ...

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