Credit must be given to the creator. Only noncommercial uses of the work are permitted. No derivatives or adaptations of the work are permitted.

To achieve higher quality on today's multimillion-gate designs and high-speed ASICs, structured DFT (design-for-test) methodologies such as scan, at-speed test, scan compression, and BIST (built-in ...

SoC sub-components (IPs) generally come from various sources – internal and external – and with that it has become necessary that designers ensure the RTL is testable. If the RTL has testability ...

When existing advanced 2D designs already push the limits of design-for-test (DFT) tools, what hope do developers have of managing DFT for 3D devices? Can anyone afford the tool run time, on-chip area ...

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...