The copper target was operated at voltages of 11 kV, 12 kV, 13 kV, and 14 kV for the electron source, and a 50 kV configuration using a molybdenum target was used as a representative example for the ...

Electron microscopy combined with X-ray microanalysis represents a pivotal suite of techniques that have transformed research in materials science, physics and engineering. Utilizing focused beams of ...

In this interview, Jonathan Lee, an Application Scientist at Gatan, talks to AZoM about improving sample Analysis using combined cathodoluminescence (CL) and energy dispersive spectroscopy (EDS).

AES operates on the principle of the Auger effect, named after the French physicist Pierre Auger. When a material's surface is bombarded with a beam of high-energy electrons or photons, it causes the ...

Image usage restrictions: News organizations may use or redistribute this image, with proper attribution, as part of news coverage of this paper only.

TEM works by accelerating electrons, typically with energies between 80 and 300 kV, and directing them through a specimen thin enough for electron transmission. Because of their very short wavelength ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...

Efficiently identify and map tire fillers with streamlined material analysis—explore the details in this application note.

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.